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JESD48B-2005 Product Discontinuance 2011-02-16
JESD49A-2005 Procurement Standard for Semiconductor Die Products ... 2011-02-16
JESD52-1995 STANDARD FOR DESCRIPTION OF LOW VOLTAGE... 2011-02-16
JESD51-1-1995 Integrated Circuits Thermal Measurement Method - Electrical ... 2011-02-16
JESD51-3-1996 LOW EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD ... 2011-02-16

JESD51-4-1997 THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP) 2011-02-16
JESD51-5-1999 EXTENSION OF THERMAL TEST BOARD STANDARDS ... 2011-02-16
JESD51-6-1999 Integrated Circuit Thermal Test Method Environmental ... 2011-02-16
JESD51-8-1999 Integrated Circuit Thermal Test Method Environmental ... 2011-02-16
JESD51-9-2000 Test Boards for Area Array Surface Mount Package ... 2011-02-16

JESD24-1-2002 ADDENDUM No. 1 to JESD24 - METHOD FOR MEASUREMENT ... 2011-02-16
JESD24-3-2002 ADDENDUM No. 3 to JESD24 - THERMAL IMPEDANCE ... 2011-02-16
JESD24-2-2002 ADDENDUM No. 2 to JESD24 - GATE CHARGE TEST METHOD 2011-02-16
JESD24-4-2002 ADDENDUM No. 4 to JESD24 - THERMAL IMPEDANCE ... 2011-02-16
JESD24-5-2002 ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED ... 2011-02-16

JESD24-11-2002 Power MOSFET Equivalent Series Gate Resistance ... 2011-02-16
JESD27-1993 CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES 2011-02-16
JESD25-2002 Measurement of Small-Signal Transistor ... 2011-02-16
JESD28-1-2001 N-Channel MOSFET Hot Carrier Data Analysis 2011-02-16
MIL-DTL-82646B-2008 2011-02-16

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